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XPS study of diamond-like carbon-based nanocomposite films

  • S. Zhang*
  • , Y. Q. Fu
  • , X. L. Bui
  • , H. J. Du
  • *Corresponding author for this work
  • Nanyang Technological University
  • Singapore-MIT Alliance

Research output: Contribution to journalArticlepeer-review

Abstract

X-ray photoelectron spectroscopy (XPS) analysis of amorphous carbon (a-C)-based nanocomposite films has been carried out. Four bonding types of carbon are revealed from the C 1s spectra: C-C sp 2 and sp 3 bonding, C-O and C-Ti bonding. With the introduction of Ti and Al into the a-C matrix, the carbon sp 3/sp 2 ratio decreases significantly. XPS results also confirm that the Al doped in the film basically exists as an elemental Al in the a-C matrix, and the titanium is mostly bonded with carbon to form nc-TiC.

Original languageEnglish
Pages (from-to)797-802
Number of pages6
JournalInternational Journal of Nanoscience
Volume3
Issue number6
DOIs
StatePublished - Dec 2004
Externally publishedYes

Keywords

  • Diamond-like carbon
  • Nanocomposite
  • Sputtering
  • XPS

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