Abstract
Testing is considered as a bottle-neck for the development of SoC. This paper proposes a new wrapper scan chain balance algorithm for minimizing IP testing time. This algorithm calculates the mean value of wrapper scan chains firstly, then a value range is generated with a given allowance, this value range is called Mean-Value Allowance in this paper. The IP internal scan chains are sorted in descending order of the length. Every time the longest internal scan chain is successively assigned to a wrapper scan chain, until whose length is in the value range indicated by Mean-Value Allowance. Experiments on all the test sets in ITC'02 SoC Test Benchmarks approve that this algorithm effectively reduces the IP testing time through wrapper scan chain balance design.
| Original language | English |
|---|---|
| Pages (from-to) | 2290-2296 |
| Number of pages | 7 |
| Journal | Yi Qi Yi Biao Xue Bao/Chinese Journal of Scientific Instrument |
| Volume | 32 |
| Issue number | 10 |
| State | Published - Oct 2011 |
Keywords
- Balance algorithm
- SoC test
- Wrapper scan chain
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