Skip to main navigation Skip to search Skip to main content

Would stress always lead to bad outcome? the differentiation of job stress and mediating effects of job engagement

  • Harbin Institute of Technology Shenzhen

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Stress has caused critical problems in information technology-intensified organizations. Besides the relationship between job engagement and job performance, the model highlights the relationship between two kinds of stress (hindrance stress and challenge stress) and job engagement, which are neglected by IT studies. Data will be gathered from IT professionals in Chinese IT companies. The findings can help improving IT professionals' job performance by setting them different difficulties of work tasks to encourage their high level job engagement. Implications and suggestions for future research are discussed.

Original languageEnglish
Title of host publication19th International Conference on Industrial Engineering and Engineering Management
Subtitle of host publicationEngineering Economics Management
Pages999-1007
Number of pages9
DOIs
StatePublished - 2013
Externally publishedYes
Event19th International Conference on Industrial Engineering and Engineering Management: Engineering Economics Management - Changsha, China
Duration: 27 Oct 201229 Oct 2012

Publication series

Name19th International Conference on Industrial Engineering and Engineering Management: Engineering Economics Management

Conference

Conference19th International Conference on Industrial Engineering and Engineering Management: Engineering Economics Management
Country/TerritoryChina
CityChangsha
Period27/10/1229/10/12

Keywords

  • Challenge stress
  • Hindrance stress
  • Job engagement
  • Job performance
  • Job stress

Fingerprint

Dive into the research topics of 'Would stress always lead to bad outcome? the differentiation of job stress and mediating effects of job engagement'. Together they form a unique fingerprint.

Cite this