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Water treatment based on atomically engineered materials: Atomic layer deposition and beyond

  • Xiaobin Yang
  • , Alex B.F. Martinson
  • , Jeffrey W. Elam
  • , Lu Shao*
  • , Seth B. Darling*
  • *Corresponding author for this work
  • School of Chemistry and Chemical Engineering, Harbin Institute of Technology
  • Argonne National Laboratory

Research output: Contribution to journalReview articlepeer-review

Abstract

Global water stress and challenges for producing sufficient supplies of fit-for-purpose water are amplifying. Atomically engineered interfaces are emerging as a powerful tool in the fabrication of advanced water treatment materials. Atomic layer deposition (ALD) and recently developed related methods, such as sequential infiltration synthesis (SIS), offer a tremendously diverse library of chemistries for interface functionalization. Thickness, stoichiometry, and physicochemical properties can be manipulated with precision. We review their fundamental physical chemistry and processing factors. ALD/SIS engineering strategies, including direct deposition, growth with intermediate layers, and secondary treatment are presented with realization of efficient water treatment. We lay out a pathway to establishing an ALD/SIS-based universal functionalization platform for water treatment, including sensitization strategies, in situ regulation, secondary reactions, and simulation/machine learning. We also provide a perspective on ALD/SIS-based interface engineering via synergy with other widely used interface engineering techniques to develop facile, versatile, and energy-efficient strategies for tackling increasingly complex water challenges.

Original languageEnglish
Pages (from-to)3515-3548
Number of pages34
JournalMatter
Volume4
Issue number11
DOIs
StatePublished - 3 Nov 2021
Externally publishedYes

Keywords

  • atomic layer deposition
  • membrane
  • sequential infiltration synthesis
  • sorbent
  • water treatment

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