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Voltage flicker analysis based on second order blind identification

  • Guo Tiandong*
  • , Wang Qi
  • , Song Kai
  • , Shen Zhengguang
  • *Corresponding author for this work
  • School of Electrical Engineering and Automation, Harbin Institute of Technology

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

This paper introduces a method using second order blind identification (SOBI) algorithm to analyze he voltage flicker signal. An embedded matrix is constructed as the multi-channel input signals. Robust whitening is used to reduce noise and decompose data onto the signal subspace. The SOBI algorithm is used to separate the source signals and get the frequency and amplitude of the voltage flicker. Simulation results show that the proposed method based on SOBI algorithm can rapidly and accurately separate the source signals from the voltage flicker.

Original languageEnglish
Title of host publicationProceedings of the 2009 2nd International Congress on Image and Signal Processing, CISP'09
DOIs
StatePublished - 2009
Externally publishedYes
Event2009 2nd International Congress on Image and Signal Processing, CISP'09 - Tianjin, China
Duration: 17 Oct 200919 Oct 2009

Publication series

NameProceedings of the 2009 2nd International Congress on Image and Signal Processing, CISP'09

Conference

Conference2009 2nd International Congress on Image and Signal Processing, CISP'09
Country/TerritoryChina
CityTianjin
Period17/10/0919/10/09

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