Abstract
The validity of real and complex equivalent refractive index models (ERIMs) is verified for a shielding effectiveness evaluation of high-transmittance double-layer metallic meshes. Theoretical and experimental studies show that the real ERIM is invalid for thin substrates and inaccurate for thick substrates for double-layer meshes, although it has long been used successfully for single-layer meshes. However, the complex ERIM shows more reasonable results not only for double-layer but also for single-layer meshes, and the evaluation accuracy is further improved by modifying the equivalent reactance coefficient using least-squares fitting. Therefore, the modified complex ERIM is applicable in most conditions.
| Original language | English |
|---|---|
| Pages (from-to) | 5372-5378 |
| Number of pages | 7 |
| Journal | Applied Optics |
| Volume | 55 |
| Issue number | 20 |
| DOIs | |
| State | Published - 10 Jul 2016 |
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