Abstract
Copper/carbon (C/Cu) electrical contact materials are widely used in low-voltage appliances due to their exceptional conductivity and anti-ablation properties. However, the oxidation of Cu during operation and the suboptimal wettability at the C/Cu interface negatively impact its arc-resistant performance. This study explores the potential for enhancing the arc-resistant characteristics of C/Cu electrical contact materials through the alloying of La in Cu. The findings indicate that La alloying in Cu significantly decreases the contact resistance (from 50 mΩ to 2.2 mΩ) and mass loss (by 50%) of C/Cu electrical contact materials.
| Original language | English |
|---|---|
| Article number | 137669 |
| Journal | Materials Letters |
| Volume | 379 |
| DOIs | |
| State | Published - 15 Jan 2025 |
Keywords
- Arc erosion behavior
- C/Cu electrical contacts
- First-principles calculation
- Microstructure
- Rare earth
- Wettability
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