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Unraveling the new role of La on arc erosion behavior of C/Cu-based electrical contacts

  • Bingtian Li
  • , Ziyao Chen
  • , Zhen Jie Guan
  • , Runchen Yang
  • , Weijian Li*
  • , Liang Zhen
  • , Wenzhu Shao*
  • *Corresponding author for this work
  • Harbin Institute of Technology
  • Harbin Institute of Technology
  • Yantai University

Research output: Contribution to journalArticlepeer-review

Abstract

Copper/carbon (C/Cu) electrical contact materials are widely used in low-voltage appliances due to their exceptional conductivity and anti-ablation properties. However, the oxidation of Cu during operation and the suboptimal wettability at the C/Cu interface negatively impact its arc-resistant performance. This study explores the potential for enhancing the arc-resistant characteristics of C/Cu electrical contact materials through the alloying of La in Cu. The findings indicate that La alloying in Cu significantly decreases the contact resistance (from 50 mΩ to 2.2 mΩ) and mass loss (by 50%) of C/Cu electrical contact materials.

Original languageEnglish
Article number137669
JournalMaterials Letters
Volume379
DOIs
StatePublished - 15 Jan 2025

Keywords

  • Arc erosion behavior
  • C/Cu electrical contacts
  • First-principles calculation
  • Microstructure
  • Rare earth
  • Wettability

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