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Unlocking High Dielectric Tunability and Exceptional Electrocaloric Performance via Growth-Driven Domain Dynamics

  • Garima Kaura
  • , Naveen Goyal
  • , Fang Liu
  • , Sa Ma
  • , Yongjun Wu
  • , T. S. Akhil Raman
  • , Basanta Roul
  • , Saluru Baba Krupanidhi
  • , Sourav Chowdhury
  • , Zuhuang Chen
  • , Yun Long Tang
  • , K. C.James Raju
  • , Zijian Hong*
  • , N. Ravishankar
  • , Sujit Das*
  • *Corresponding author for this work
  • Indian Institute of Science Bangalore
  • CAS - Institute of Metal Research
  • University of Science and Technology of China
  • Zhejiang University
  • Taizhou Institute of Zhejiang University
  • Zhejiang University City College
  • University of Hyderabad
  • Bharat Electronics
  • German Electron Synchrotron
  • Harbin Institute of Technology (Shenzhen)

Research output: Contribution to journalArticlepeer-review

Abstract

Achieving simultaneously high dielectric tunability, thermal and frequency stability, and efficient electrocaloric performance remains a major unresolved challenge in lead-free ferroelectric films. These constraints limit the practical deployment of environmentally benign tunable components and solid-state refrigeration technologies. To address this gap, we investigate Ba0.7Ca0.3TiO3 thin films grown at 630, 670, and 700°C, establishing quantitative growth–structure–property correlations that enable co-optimization of these functionalities. By integrating dielectric spectroscopy, Rayleigh analysis, phase-field simulations, and electrocaloric measurements, we disentangle intrinsic and extrinsic contributions governing dielectric and electrocaloric behaviour. Film grown at 630°C exhibit the highest tunability (∼90%), dominated by extrinsic mechanisms with mixture of a/c nano-domains, whereas film grown at 670°C yields a stable tunability (∼85%), low dielectric loss (<0.05), high cumulative quality factor (CQF∼1.6 × 104), and excellent thermal (300–420 K) and frequency (10 kHz–1 MHz) stability. In contrast, films grown at 700°C display the best performance of electrocaloric coefficient (ξ ∼0.025 K cm kV1), refrigerant capacity (RC of ∼1900 J kg1) and an outstanding relative cooling power (RCP ≈ 1755 K2), among the highest reported for lead-free films. These results establish growth temperature as an effective control parameter for overcoming tunability–stability trade-offs in adaptive microelectronics and solid-state refrigeration.

Original languageEnglish
Article numbere73824
JournalAdvanced Materials
Volume38
Issue number42
DOIs
StatePublished - 27 Jul 2026
Externally publishedYes

Keywords

  • dielectric
  • dielectric loss
  • dielectric spectroscopy
  • materials science
  • microelectronics
  • optoelectronics
  • rayleigh scattering
  • refrigerant
  • refrigeration
  • thin film

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