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Ultraflat single-crystal hexagonal boron nitride film grown on Cu/Ni (1 1 1) for high-performance deep ultraviolet photodetectors

  • Xin Zhang
  • , Hongying Yang
  • , Zhen Su
  • , Yuqing Tian
  • , Yuming Feng
  • , Yanan Ding
  • , Huiwen Ren
  • , Linben Ling
  • , Xiaolei Chen
  • , Haiying Xiao
  • , Ping An Hu*
  • *Corresponding author for this work
  • Harbin Institute of Technology
  • School of Chemistry and Chemical Engineering, Harbin Institute of Technology
  • Harbin Institute of Technology
  • Beijing Institute of Aerospace Control Devices

Research output: Contribution to journalArticlepeer-review

Abstract

Large-area single-crystal two-dimensional (2D) semiconducting layered materials have the potential to extend Moore's law by increasing the number of transistors in integrated circuits. While monolayer single-crystal hexagonal boron nitride (h-BN) has been synthesized on molten gold surfaces and bulk copper foils using chemical vapor deposition (CVD), the scalable growth of large single-crystal mutilayer h-BN remains challenging. Here we use Cu/Ni (1 1 1) alloy foil and synthesize wafer-scale trilayer h-BN film by CVD method. The h-BN film grown on the Cu/Ni (1 1 1) alloy substrate exhibits an ultraflat surface over a large area. A set of microscopies, spectroscopies and electrical characterization techniques consistently showed that the h-BN is single crystal. This effective method for producing large-area single-crystal h-BN paves the way for future nano-electronic applications.

Original languageEnglish
Article number163316
JournalChemical Engineering Journal
Volume515
DOIs
StatePublished - 1 Jul 2025

Keywords

  • Photodetectors
  • Single-crystal
  • Wafer-scale
  • h-BN

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