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Transformation of interfacial microstructure in aged Sn-Zn-Nd solder joint

  • Peng Xue
  • , Kehong Wang
  • , Qi Zhou*
  • , Peng He
  • , Weimin Long
  • , Sujuan Zhong
  • *Corresponding author for this work
  • Nanjing University of Science and Technology
  • Zhengzhou Research Institute of Mechanical Engineering

Research output: Contribution to journalArticlepeer-review

Abstract

The interfacial microstructure in Sn-Zn-Nd solder joint aged at 360 hours, 720 hours, and 3 000 hours was investigated respectively. The results indicated that the transformation of interfacial intermetallic compound layer was dominated by the atom diffusion. After long-term aging, the composition of intermetallic compound layer transformed from Cu5Zn8 into a mixed Cu-Zn-Sn compounds. During the aging process, the diffusion-induced stresses also accumulated at the interface between solder matrix and Cu pad. When it reached a certain value, voids and fractures was formed in the intermetallic compound layer, which deteriorated the soldered joint properties.

Original languageEnglish
Pages (from-to)33-36
Number of pages4
JournalHanjie Xuebao/Transactions of the China Welding Institution
Volume37
Issue number1
StatePublished - 25 Jan 2016

Keywords

  • Interface
  • Intermetallic compound
  • Sn-Zn
  • Solder joint

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