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Towards Prognosis on Interconnected Distributed Closed-Loop Control System: A Data-Driven Perspective

  • Jiusi Zhang*
  • , Jilun Tian
  • , Kexin Liu
  • , Hao Luo
  • , Shen Yin
  • *Corresponding author for this work
  • University of Electronic Science and Technology of China
  • Harbin Institute of Technology
  • School of Economics and Management, Harbin Engineering University
  • Norwegian University of Science and Technology

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Through distributed monitoring and control, interconnected distributed systems have extensively promoted the efficiency of industrial production. Remaining useful life (RUL) prediction is a critical aspect of system prognosis. The existing RUL prediction approaches are mainly for conventional centralized systems. How to accomplish the RUL prediction and corresponding faulttolerant control on interconnected distributed systems needs further work. Consequently, from a data-driven perspective, this article integrates the state space model and the stochastic degradation process model. A datadriven particle filter approach is proposed for accurate hidden degradation state estimation and RUL prediction for interconnected distributed closed-loop control systems. Moreover, considering the degradation of system performance, this paper designs a fault-tolerant control strategy for the system, which can alleviate the degradation of the entire system to a certain extent. In this paper, an inertial platform control system is adopted to verify the proposed approach. Experiment shows that the proposed approach can accurately predict and extend the RUL.

Original languageEnglish
Title of host publication2025 IEEE 34th International Symposium on Industrial Electronics, ISIE 2025
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798350374797
DOIs
StatePublished - 2025
Event34th IEEE International Symposium on Industrial Electronics, ISIE 2025 - Toronto, Canada
Duration: 20 Jun 202523 Jun 2025

Publication series

NameIEEE International Symposium on Industrial Electronics
ISSN (Print)2163-5137
ISSN (Electronic)2163-5145

Conference

Conference34th IEEE International Symposium on Industrial Electronics, ISIE 2025
Country/TerritoryCanada
CityToronto
Period20/06/2523/06/25

Keywords

  • Data-driven
  • Faulttolerant control
  • Interconnected distributed closed-loop control system
  • Prognosis
  • Remaining useful life

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