Abstract
A series of large-sized (maximum 16 × 16 × 20 mm3), high-quality K1-xNaxNbO3 (x = 0.118, 0.378, 0.462, 0.545, and 0.666) single crystals were successfully cultivated using the top-seeded solution growth method. The crystallization and structures of the K1-xNaxNbO3 single crystals were studied using first-principles calculations and X-ray diffraction, respectively. The segregation of the K1-xNaxNbO3 single crystals was investigated, which enabled precise control of the individual components of the crystals during growth. Excellent properties were obtained without annealing, including a low dielectric loss (minimum 0.2%), a saturated hysteresis loop with a low coercive field Ec, a large piezoelectric coefficient d33 (d33 = 161 pC/N when x = 0.378), and a low leakage current density J (10-6 A/cm2). These results indicated that the K1-xNaxNbO3 (x = 0.118, 0.378, 0.462, 0.545, and 0.666) crystals can be used as a high-quality, lead-free piezoelectric material.
| Original language | English |
|---|---|
| Pages (from-to) | 1180-1185 |
| Number of pages | 6 |
| Journal | Crystal Growth and Design |
| Volume | 15 |
| Issue number | 3 |
| DOIs | |
| State | Published - 4 Mar 2015 |
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