Skip to main navigation Skip to search Skip to main content

Top-k reliability search on uncertain graphs

  • Harbin Institute of Technology

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Uncertain graphs have been widely used to represent graph data with inherent uncertainty in structures. Reliability search is a fundamental problem in uncertain graph analytics. This paper studies a new problem, the top-k reliability search problem on uncertain graphs, that is, finding k vertices v with the highest reliabilities of connections from a source vertex s to v. Note that the existing algorithm for the threshold-based reliability search problem is inefficient for the top-k reliability search problem. We propose a new algorithm to efficiently solve the top-k reliability search problem. The algorithm adopts two important techniques, namely the BFS sharing technique and the offline sampling technique. The BFS sharing technique exploits overlaps among different sampled possible worlds of the input uncertain graph and performs a single BFS on all possible worlds simultaneously. The offline sampling technique samples possible worlds offline and stored them using a compact structure. The algorithm also takes advantages of bit vectors and bitwise operations to improve efficiency. Moreover, we generalize the top-k reliability search problem to the multi-source case and show that the multi-source case of the problem can be equivalently converted to the single-source case of the problem. Extensive experiments carried out on both real and synthetic datasets verify that the optimized algorithm outperforms the baselines by 1 - 2 orders of magnitude in execution time while achieving comparable accuracy. Meanwhile, the optimized algorithm exhibits linear scalability with respect to the size of the input uncertain graph.

Original languageEnglish
Title of host publicationProceedings - 15th IEEE International Conference on Data Mining, ICDM 2015
EditorsCharu Aggarwal, Zhi-Hua Zhou, Alexander Tuzhilin, Hui Xiong, Xindong Wu
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages659-668
Number of pages10
ISBN (Electronic)9781467395038
DOIs
StatePublished - 5 Jan 2016
Event15th IEEE International Conference on Data Mining, ICDM 2015 - Atlantic City, United States
Duration: 14 Nov 201517 Nov 2015

Publication series

NameProceedings - IEEE International Conference on Data Mining, ICDM
Volume2016-January
ISSN (Print)1550-4786

Conference

Conference15th IEEE International Conference on Data Mining, ICDM 2015
Country/TerritoryUnited States
CityAtlantic City
Period14/11/1517/11/15

Fingerprint

Dive into the research topics of 'Top-k reliability search on uncertain graphs'. Together they form a unique fingerprint.

Cite this