TY - GEN
T1 - Tongue line extraction
AU - Liu, Laura Li
AU - Zhang, David
AU - Kumar, Ajay
AU - Wu, Xiangqian
PY - 2008
Y1 - 2008
N2 - Tongue line refers to the surface of the tongue covered with fissures or lines in deep or shallow shape and is one type of important features in clinical practice of Traditional Chinese Tongue Diagnosis (TCTD). However, it is hard to extract tongue lines completely due to the large variation of the widths of tongue lines and the strong noise caused by the rough surface of tongue and uneven illumination. In this paper, an improved wide line detector (WLD) is presented for tongue line extraction. Based on the characteristics of tongue lines, the original WLD is improved to avoid the undesired separation of a wide line and the influence of uneven lighting conditions. The proposed method has been tested on a total of 286 tongue line images and our experimental results demonstrate that the improved WLD significantly outperforms the original WLD for tongue line extraction by improving the TPR 16.5%, FPR 44.6% and PM 33.4%, respectively.
AB - Tongue line refers to the surface of the tongue covered with fissures or lines in deep or shallow shape and is one type of important features in clinical practice of Traditional Chinese Tongue Diagnosis (TCTD). However, it is hard to extract tongue lines completely due to the large variation of the widths of tongue lines and the strong noise caused by the rough surface of tongue and uneven illumination. In this paper, an improved wide line detector (WLD) is presented for tongue line extraction. Based on the characteristics of tongue lines, the original WLD is improved to avoid the undesired separation of a wide line and the influence of uneven lighting conditions. The proposed method has been tested on a total of 286 tongue line images and our experimental results demonstrate that the improved WLD significantly outperforms the original WLD for tongue line extraction by improving the TPR 16.5%, FPR 44.6% and PM 33.4%, respectively.
UR - https://www.scopus.com/pages/publications/77957951095
U2 - 10.1109/icpr.2008.4761651
DO - 10.1109/icpr.2008.4761651
M3 - 会议稿件
AN - SCOPUS:77957951095
SN - 9781424421756
T3 - Proceedings - International Conference on Pattern Recognition
BT - 2008 19th International Conference on Pattern Recognition, ICPR 2008
PB - Institute of Electrical and Electronics Engineers Inc.
ER -