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ToF-SIMS study of carbon diffusion in Co-Pt-TiO 2 composite and ruthenium films

  • Jianhui Wang*
  • , Sam Zhang
  • *Corresponding author for this work
  • Nanyang Technological University

Research output: Contribution to journalArticlepeer-review

Abstract

In this paper, the diffusion behavior of hydrogenated amorphous carbon into Co-Pt-TiO 2 and Ruthenium films was first investigated. Impact of carbon on Co-Pt-TiO 2 composite film and its diffusion in Co-Pt-TiO 2 and ruthenium films were studied using Time-of-Flight Secondary Ion Mass Spectroscopy. Magnetic coercivity drop was observed for Co-Pt-TiO 2films coated with ruthenium and carbon hybrid overcoat at varied thickness ratio. Co-Pt-TiO 2 film is widely used in perpendicular magnetic recording. Carbon depth profile showed that carbon readily diffuses in Co-Pt-TiO 2 film because of its porous structure. However, carbon diffusion in ruthenium film is limited even annealing up to 200 °C in argon. Carbon's diffusion length and coefficient in Co-Pt-TiO 2 are much higher than that in Ru film. The activation energy was calculated for both cases.

Original languageEnglish
Pages (from-to)770-774
Number of pages5
JournalJournal of Nanoscience and Nanotechnology
Volume10
Issue number2
DOIs
StatePublished - Feb 2010
Externally publishedYes

Keywords

  • Carbon
  • Diffusion
  • Ruthenium barrier
  • SIMS
  • TEM
  • XRD

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