TY - GEN
T1 - Time-Resolved Imaging and Spectral Study of Plume Evolution from Laser-Induced Damage of Fused Silica
AU - Hang, Yuan
AU - Ziqiang, Dan
AU - Yuxin, Li
AU - Chengyu, Zhu
N1 - Publisher Copyright:
© 2024 IEEE.
PY - 2024
Y1 - 2024
N2 - During the process of UV laser-induced damage of fused silica, laser energy deposition results in material explosion, forming a plasma plume on the rear surface. The study of this plume can provide insights into the physical processes of laser-induced energy deposition and material evolution in the initial stages of damage, which is crucial for damage dynamics research. Moreover, spectral analysis of plasma spontaneous emission during laser-induced damage also serves as an effective method for studying the plume. In this paper, based on time-resolved imaging and time-resolved spectroscopy, the evolution of the plasma plume on the rear surface following laser-induced damage is experimentally investigated. Based on the findings, the whole process of the plume evolution is analyzed, and the response behaviors after material detonation, gasification, and ionization are revealed.
AB - During the process of UV laser-induced damage of fused silica, laser energy deposition results in material explosion, forming a plasma plume on the rear surface. The study of this plume can provide insights into the physical processes of laser-induced energy deposition and material evolution in the initial stages of damage, which is crucial for damage dynamics research. Moreover, spectral analysis of plasma spontaneous emission during laser-induced damage also serves as an effective method for studying the plume. In this paper, based on time-resolved imaging and time-resolved spectroscopy, the evolution of the plasma plume on the rear surface following laser-induced damage is experimentally investigated. Based on the findings, the whole process of the plume evolution is analyzed, and the response behaviors after material detonation, gasification, and ionization are revealed.
KW - electron temperature
KW - fused silica
KW - laser-induced damage
KW - plasma plume
KW - spectrum
UR - https://www.scopus.com/pages/publications/105007283615
U2 - 10.1109/AISOMT64170.2024.10992206
DO - 10.1109/AISOMT64170.2024.10992206
M3 - 会议稿件
AN - SCOPUS:105007283615
T3 - 2024 IEEE Academic International Symposium on Optoelectronics and Microelectronics Technology, AISOMT 2024
SP - 97
EP - 100
BT - 2024 IEEE Academic International Symposium on Optoelectronics and Microelectronics Technology, AISOMT 2024
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2024 IEEE Academic International Symposium on Optoelectronics and Microelectronics Technology, AISOMT 2024
Y2 - 21 November 2024 through 22 November 2024
ER -