@inproceedings{640b1739c1064fb89e50768266939057,
title = "Time-of-flight Extraction Method Based on Cross-correlation for Stress Measurement",
abstract = "The basic principle of ultrasonic-based absolute stress detection is to estimate the stress by detecting the propagation time of ultrasound in the medium. Because the change of wave speed caused by stress is very weak, how to obtain the propagation time of ultrasonic waves in the medium stably is the key problem. The commonly used time-of-flight (TOF) extraction methods include the peak value method or the threshold method, these methods are very sensitive to noise and waveform distortion in the signal, and have poor stability when the echo's signal-to-noise ratio (SNR) is low. Therefore, we adopt a TOF extraction method based on wavelet noise reduction algorithm and cross-correlation method. The SNR of the echo is improved by wavelet noise reduction, and the TOF is obtained by the cross-correlation method. Moreover, the acquisition mode of one transmitter and two receivers is adopted to solve the reference signal consistency problem in the cross-correlation method. The experimental results show that compared with the peak value method, the cross-correlation method improves the accuracy and stability of TOF extraction.",
keywords = "cross-correlation, signal processing, stress measurement, time-of-flight extraction, wavelet noise reduction",
author = "Jianfei Yao and Yunxuan Gong and Yongzhi Liu and Zhili Long",
note = "Publisher Copyright: {\textcopyright} 2022 IEEE.; 2022 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2022 ; Conference date: 08-08-2022 Through 12-08-2022",
year = "2022",
doi = "10.1109/3M-NANO56083.2022.9941551",
language = "英语",
series = "2022 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2022 - Proceedings",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "396--400",
editor = "Zhidong Wang and Li Lei and Fan Yang",
booktitle = "2022 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2022 - Proceedings",
address = "美国",
}