Skip to main navigation Skip to search Skip to main content

Thermal activation approaches to deformation mechanisms for high Nb containing TiAl base alloys

  • Zi Cheng Liu*
  • , Yan Li Wang
  • , Jun Pin Lin
  • , Wei Jun Zhang
  • , Guo Liang Chen
  • *Corresponding author for this work
  • University of Science and Technology Beijing

Research output: Contribution to journalArticlepeer-review

Abstract

The deformation mechanisms in a wide temperature range from room temperature to 1200 K were investigated by thermal activation approach. Using observed instantaneous stress response to the strain rate jump (Δσtr), the activation volume Va, then the activation enthalpy ΔH, activation free enthalpy ΔG and activation entropy ΔS were calculated. The apparent activation energy of high temperature deformation is estimated to be 3.66 eV, which is larger than the self-diffusion coefficient of binary TiAl (3.01 eV). The dislocations at 1173 K are generally curved or bowed, even helical-shaped dislocations. The climb of ordinary dislocations as well as twinning has greatly contributed to the plastic deformation. The CRSS at 1173 K is estimated to be 180 MPa. The higher resisting stress at both room temperature and elevated temperature might relate to the high Nb content of the alloy.

Original languageEnglish
Pages (from-to)1081-1086
Number of pages6
JournalTransactions of Nonferrous Metals Society of China (English Edition)
Volume12
Issue number6
StatePublished - Dec 2002
Externally publishedYes

Keywords

  • Deformation mechanisms
  • Thermal activation approach
  • TiAl

Fingerprint

Dive into the research topics of 'Thermal activation approaches to deformation mechanisms for high Nb containing TiAl base alloys'. Together they form a unique fingerprint.

Cite this