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Therapeutic carbon-ion effects on monolithic active pixel sensor with 130 nm high-resistivity process

  • B. Yang
  • , J. Duan
  • , L. Jing
  • , Y. Wang
  • , F. Fu
  • , B. Cao
  • , C. Zhao*
  • *Corresponding author for this work
  • Harbin University of Science and Technology
  • Shanghai Institute of Satellite Engineering
  • Harbin Institute of Technology
  • Heilongjiang University
  • CAS - Institute of Modern Physics
  • University of Chinese Academy of Sciences

Research output: Contribution to journalArticlepeer-review

Abstract

A Monolithic Active Pixel Sensor (MAPS) is currently being designed in a new 130 nm high-resistivity (>1 kω·cm) CMOS process for full image beam monitoring in the carbon-ion therapeutic facility. The charge sensing node collects the charge deposited by the carbon ions that pass through the MAPS. A 3-dimensional TCAD model of the pixel has been established to study the carbon-ion induced process in the MAPS. This paper will discuss the thickness of the depletion layer, the charge collection efficiency, the charge collection time, and the characteristics of NMOS devices with different bias voltages and carbon-ion hitting locations.

Original languageEnglish
Article numberC01059
JournalJournal of Instrumentation
Volume17
Issue number1
DOIs
StatePublished - Jan 2022

Keywords

  • Instrumentation for heavy-ion therapy
  • Particle tracking detectors (Solid-state detectors)
  • Solid state detectors

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