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The study of infrared photocarrier radiometry based on Si semiconductor

  • Lei Qin*
  • , Junyan Liu
  • , Yang Wang
  • *Corresponding author for this work
  • School of Mechatronics Engineering, Harbin Institute of Technology

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Infrared photocarrier adiometry(PCR) has shown advantages of pure detection signal, bigger detection depth and more clear results since it emerges. But it is still in the starting stage. Generation and distribution of photocarrier excitated by modulated laser is stated, and the principle of PCR is discussed. Experiment on different sweeping frequencies is carried out and frequent characteristics are studied.The principle and experimental results are compared with PTR.The results show the most fit modulated frequency of PCR is around 10kHz, and the differences between the defect and non-defect area is bigger than that of PTR.

Original languageEnglish
Title of host publicationMaterials, Mechanical Engineering and Manufacture
Pages1623-1626
Number of pages4
EditionPART 1
DOIs
StatePublished - 2013
Externally publishedYes
Event2nd International Conference on Applied Mechanics, Materials and Manufacturing, ICAMMM 2012 - Changsha, China
Duration: 17 Nov 201218 Nov 2012

Publication series

NameApplied Mechanics and Materials
NumberPART 1
Volume268
ISSN (Print)1660-9336
ISSN (Electronic)1662-7482

Conference

Conference2nd International Conference on Applied Mechanics, Materials and Manufacturing, ICAMMM 2012
Country/TerritoryChina
CityChangsha
Period17/11/1218/11/12

Keywords

  • Infrared radiation
  • PCR technology
  • Photocarrier
  • Shortwave radiation

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