TY - GEN
T1 - The role of FSV in EMC characterization
AU - Duffy, Alistair
AU - Zhang, Gang
N1 - Publisher Copyright:
© 2018 IEEE.
PY - 2018/6/22
Y1 - 2018/6/22
N2 - The Feature Selective Validation (FSV) method is both a de factor and de jure standard for comparing data for validation of computational electromagnetics in the EMC domain. However, the 'domain agnostic' approach means that it is also seeing application outside its initial area of application. The focus of development was mostly on comparisons of, or with, numerical data but the potential application to measured data was proposed but has not been fully investigated. This paper addresses radio frequency EMC characterization applications of FSV with a view to assessing its suitability for a new IEEE Standards Project, P2665, 'Statistical Process Control for EMC Test Laboratories'. The conclusions are that the FSV technique may, indeed, provide a suitable objective comparison method for visually complex data or for data that requires comparison with multiple degrees of freedom but further analysis is required in order to define the clear limits of operation.
AB - The Feature Selective Validation (FSV) method is both a de factor and de jure standard for comparing data for validation of computational electromagnetics in the EMC domain. However, the 'domain agnostic' approach means that it is also seeing application outside its initial area of application. The focus of development was mostly on comparisons of, or with, numerical data but the potential application to measured data was proposed but has not been fully investigated. This paper addresses radio frequency EMC characterization applications of FSV with a view to assessing its suitability for a new IEEE Standards Project, P2665, 'Statistical Process Control for EMC Test Laboratories'. The conclusions are that the FSV technique may, indeed, provide a suitable objective comparison method for visually complex data or for data that requires comparison with multiple degrees of freedom but further analysis is required in order to define the clear limits of operation.
UR - https://www.scopus.com/pages/publications/85050073451
U2 - 10.1109/ISEMC.2018.8394093
DO - 10.1109/ISEMC.2018.8394093
M3 - 会议稿件
AN - SCOPUS:85050073451
T3 - 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018
SP - 133
BT - 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 60th IEEE International Symposium on Electromagnetic Compatibility and 9th IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018
Y2 - 14 May 2018 through 18 May 2018
ER -