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The friction forces between SI tip and multilayer graphene

  • Southeast University, Nanjing
  • Harbin Institute of Technology Weihai

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Mechanical peeling method is used to prepare multilayer graphene on silicon wafer with natural oxide, and the layer number of graphene is determined through atomic force microsopy (AFM) topography image and optical image. The friction force between Silicon tip and multilayer graphene and SiO 2/Si substrates is measured with AFM. It is found that the friction force is reduced with the increase of the graphene layer number and approaches the value between the Si tip and graphite. Through comparing the tip sliding on graphene with different layers, the deformation of graphene is believed to be the main reason causing the decrease of the friction force with the layer number. When the normal load is much larger than the adhesion force, friction force increases with normal load linearly. However, while normal load closes to the adhesion force, friction force is independent of the normal load.

Original languageEnglish
Title of host publicationMicro- and Nano-Systems Engineering and Packaging
PublisherAmerican Society of Mechanical Engineers (ASME)
Pages25-28
Number of pages4
EditionPARTS A AND B
ISBN (Print)9780791845257
DOIs
StatePublished - 2012
Externally publishedYes
EventASME 2012 International Mechanical Engineering Congress and Exposition, IMECE 2012 - Houston, TX, United States
Duration: 9 Nov 201215 Nov 2012

Publication series

NameASME International Mechanical Engineering Congress and Exposition, Proceedings (IMECE)
NumberPARTS A AND B
Volume9

Conference

ConferenceASME 2012 International Mechanical Engineering Congress and Exposition, IMECE 2012
Country/TerritoryUnited States
CityHouston, TX
Period9/11/1215/11/12

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