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The application of ultrasonic phased array system to the inspection of fillet weld of flat plate

  • School of Civil Engineering, Harbin Institute of Technology
  • Harbin Institute of Technology
  • Dalian University of Technology

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The ultrasonic phased array inspection imaging system was developed in this paper, which is integrated on the basis of the each module and the exploitation of subsystem, it is made up of computer, ultrasonic circuit system, scanning device, phased array transducer and imaging software. The ultrasonic phased array inspection imaging system has the functions of controlling ultrasonic transmission and reception, controlling sound beam steering and focusing, controlling scanner moving, receiving flaw information and position formation, restructuring flaw image and commenting damage. Experiment was done on the fillet weld block of T shape flat plate with some artifical flaws using the ultrasonic phased array system, the flaws characteristic could be exactly estimated through comparing and analyzing the flaws position in B-scan image and the waveform feature in A-scan curve, and the flaws size could be measured from the image of C-scan and D-scan. Experiment results indicate that the flaws detected by the manual ultrasonic inspection technology could be found over again by the ultrasonic phased array inspection technology, the flaws size measured by the latter is close to the former, the whole trend of development of flaws are factually imaging by the latter.

Original languageEnglish
Title of host publicationFundamental Problems of Optoelectronics and Microelectronics III
DOIs
StatePublished - 2007
EventFundamental Problems of Optoelectronics and Microelectronics III - Harbin, China
Duration: 12 Sep 200614 Sep 2006

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6595 I
ISSN (Print)0277-786X

Conference

ConferenceFundamental Problems of Optoelectronics and Microelectronics III
Country/TerritoryChina
CityHarbin
Period12/09/0614/09/06

Keywords

  • Inspection
  • Nondestructive testing
  • Phased array
  • Ultrasonic
  • Weld

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