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Textured growth of Cu6Sn5 grains formed at a Sn3.5Ag/Cu interface

  • Mingyu Li*
  • , Ming Yang
  • , Jongmyung Kim
  • *Corresponding author for this work
  • Harbin Institute of Technology Shenzhen
  • Jeonnam Provincial College

Research output: Contribution to journalArticlepeer-review

Abstract

The growth orientations of Cu6Sn5 grains formed at a Sn3.5Ag/polycrystalline Cu interface were investigated. Similar as reported on Cu single crystals, strong textures in Cu6Sn5 layers can also form on polycrystalline Cu, but the texture formation mechanisms differ. The texture formation on polycrystalline Cu occurs during the ripening growth and results from the differences in stability of the interfacial grains with various orientations at different temperatures. A reaction temperature of 240 °C causes the Cu6Sn5 layer to form [0001] texture in the direction normal to the substrate, and a special morphology of interfacial Cu6Sn5 grains can be formed on this layer to reinforce joint properties.

Original languageEnglish
Pages (from-to)135-137
Number of pages3
JournalMaterials Letters
Volume66
Issue number1
DOIs
StatePublished - 1 Jan 2012

Keywords

  • Crystal growth
  • CuSn
  • Lead-free solder
  • Texture

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