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Test wrapper algorithm for scan chain balance based on entropy increase hybrid differential evolution

  • School of Information Science and Engineering, Harbin Institute of Technology Weihai
  • Harbin Institute of Technology

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

A well cores reused-based wrapper design is an important approach to minimize SOC test application time and test costs. The combinatorial optimization problem of core wrapper design has been proven to be a NP-hard problem. In this paper, a wrapper scan chain balance algorithm with entropy increase hybrid discrete differential evolution (EIHDE) is proposed to solve the core wrapper problem, which is inspired by thermodynamic system principle of entropy increase and outstanding global searching ability of Differential Evolution (DE). The proposed approach develops a cooperative mutation strategy based on entropy increase for the problem to preserving its interesting search mechanism for discrete domains. In the proposed model, two cooperative encode modes of individuals are introduced for standard differential mutation and the cooperative entropy increase mutation: integer encode mode and binary encode mode. EIHDE controls the search space by differential mutation, and search for superior individual in local space by entropy increase mutation. The combination of two kinds of mutation operations promotes the optimization ability considerably and achieves a better tradeoff between exploitation and exploration. The experimental results of the ITC'02 SOC test benchmarks show that EIHDE can achieve more balanced results compared with other algorithms.

Original languageEnglish
Title of host publicationICEMI 2017 - Proceedings of IEEE 13th International Conference on Electronic Measurement and Instruments
EditorsWu Juan, Yin Jiali, Zhang Qi
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages204-210
Number of pages7
ISBN (Electronic)9781509050345
DOIs
StatePublished - 2 Jul 2017
Event13th IEEE International Conference on Electronic Measurement and Instruments, ICEMI 2017 - Yangzhou, China
Duration: 20 Oct 201722 Oct 2017

Publication series

NameICEMI 2017 - Proceedings of IEEE 13th International Conference on Electronic Measurement and Instruments
Volume2018-January

Conference

Conference13th IEEE International Conference on Electronic Measurement and Instruments, ICEMI 2017
Country/TerritoryChina
CityYangzhou
Period20/10/1722/10/17

Keywords

  • Embedded core wrapper
  • SOC test
  • VLSI design for test
  • discreet differential evolution

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