Abstract
In this paper, a test set optimization method based on the genetic reordering is presented, which optimizes the row vectors' order of the test set's vector-fault matrix by genetic algorithm and adopts the row-column elimination as the evaluation method in the genetic process. Experiment results show that the method effectively reduces the number of the test vectors and ensures that no redundant test vector left in the optimal test set obtained.
| Original language | English |
|---|---|
| Pages (from-to) | 2335-2338 |
| Number of pages | 4 |
| Journal | Tien Tzu Hsueh Pao/Acta Electronica Sinica |
| Volume | 35 |
| Issue number | 12 |
| State | Published - Dec 2007 |
Keywords
- Genetic algorithm
- Row-column elimination
- Test set optimization
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