@inproceedings{fe34f77a694e4e42a3ec5922b7338794,
title = "Test sequencing strategy with imperfect test",
abstract = "In this paper, we consider imperfect test sequencing problem under a single fault assumption. Our approach is based on the comparing the imperfect test phenomenon to perfect test, and the integrating this phenomenon into the test sequencing strategy, called IPT-TS strategy. The results of numerical simulations on the test case show that the proposed approach significantly decreases test costs and is more adaptable to solve test sequencing problems with imperfect test for diagnosis when compared with that based on the random strategy.",
keywords = "Fault diagnosis, Imperfect test, Test sequencing",
author = "Wei Wang and Daren Yu and Qinghua Hu",
year = "2007",
doi = "10.1109/ICEMI.2007.4350558",
language = "英语",
isbn = "1424411351",
series = "2007 8th International Conference on Electronic Measurement and Instruments, ICEMI",
pages = "1744--1747",
booktitle = "2007 8th International Conference on Electronic Measurement and Instruments, ICEMI",
note = "2007 8th International Conference on Electronic Measurement and Instruments, ICEMI ; Conference date: 16-08-2007 Through 18-08-2007",
}