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Temperature dependence and Debye-Waller factors for resonant x-ray Raman scattering in solids

  • F. Gel'mukhanov*
  • , T. Privalov
  • , H. Ågren
  • *Corresponding author for this work
  • Institute of Automation and Electrometry of the Siberian Branch of the Russian Academy of Sciences

Research output: Contribution to journalArticlepeer-review

Abstract

Resonant x-ray Raman scattering is a strongly coherent process. The well defined phase relations between scattering channels through the core excited states localized at different atoms result in a conservation of the electronic, crystal momentum. However, as we show here, the zero-point and thermal vibrations dephase these scattering channels and lead to incoherent contributions with different spectral shapes. The relative strength of the coherent and incoherent contributions are found to strongly depend on temperature via a Debye-Waller factor. This results in a characteristic temperature dependence of the spectral profile of the resonant x-ray Raman scattering.

Original languageEnglish
Pages (from-to)13996-14005
Number of pages10
JournalPhysical Review B-Condensed Matter
Volume62
Issue number21
DOIs
StatePublished - 1 Dec 2000
Externally publishedYes

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