TEM study of SrIrO                         3                          thin films with various thicknesses grown on (0 0 1) SrTiO                         3                          substrates synthesized by pulsed laser deposition

Lunyong Zhang; Hong Yan Wu; Jian Zhou; Fei Xiang Wu; Y. B. Chen; Shu Hua Yao; Shan Tao Zhang; Yan Feng Chen

doi:10.1016/j.apsusc.2013.04.150

TEM study of SrIrO ₃ thin films with various thicknesses grown on (0 0 1) SrTiO ₃ substrates synthesized by pulsed laser deposition

Lunyong Zhang
, Hong Yan Wu
, Jian Zhou
, Fei Xiang Wu
, Y. B. Chen^*
, Shu Hua Yao
, Shan Tao Zhang
, Yan Feng Chen

^*Corresponding author for this work

Nanjing University

Research output: Contribution to journal › Article › peer-review

23 Scopus citations

Abstract

The microstructure of SrIrO ₃ thin films with various thicknesses is characterized by transmission electron microscopy. We observed that the SrIrO ₃ thin films are formed in meta-stable orthorhombic structure and demonstrate the single-crystalline quality when the thickness is thinner than 30 nm; in contrast, SrIrO ₃ thin films with thickness thicker than 30 nm are composed of both meta-stable orthorhombic and stable monoclinic SrIrO ₃ phases, and show polycrystalline quality. The interfacial structure and crystalline domain structure of orthorhombic SrIrO ₃ thin films are characterized. The formation of meta-stable orthorhombic SrIrO ₃ thin films is discussed by strain between substrates and thin films on the basis of the Gibbs formation energy difference between monoclinic and orthorhombic SrIrO ₃ phases. Stabilization of meta-stable orthorhombic SrIrO ₃ with single crystalline quality provides an ideal system to elucidate the intrinsic physical property of SrIrO ₃ . Crown

Original language	English
Pages (from-to)	282-286
Number of pages	5
Journal	Applied Surface Science
Volume	280
DOIs	https://doi.org/10.1016/j.apsusc.2013.04.150
State	Published - 1 Sep 2013
Externally published	Yes

Keywords

Thermodynamics
Thin films
Transmission electron microscopy

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10.1016/j.apsusc.2013.04.150

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Zhang, L., Wu, H. Y., Zhou, J., Wu, F. X., Chen, Y. B., Yao, S. H., Zhang, S. T., & Chen, Y. F. (2013). TEM study of SrIrO ₃ thin films with various thicknesses grown on (0 0 1) SrTiO ₃ substrates synthesized by pulsed laser deposition Applied Surface Science, 280, 282-286. https://doi.org/10.1016/j.apsusc.2013.04.150

Zhang, Lunyong ; Wu, Hong Yan ; Zhou, Jian et al. / TEM study of SrIrO ₃ thin films with various thicknesses grown on (0 0 1) SrTiO ₃ substrates synthesized by pulsed laser deposition In: Applied Surface Science. 2013 ; Vol. 280. pp. 282-286.

@article{30cea277097a4c60b410b6ab10a0ee04,

title = " TEM study of SrIrO 3 thin films with various thicknesses grown on (0 0 1) SrTiO 3 substrates synthesized by pulsed laser deposition ",

abstract = " The microstructure of SrIrO 3 thin films with various thicknesses is characterized by transmission electron microscopy. We observed that the SrIrO 3 thin films are formed in meta-stable orthorhombic structure and demonstrate the single-crystalline quality when the thickness is thinner than 30 nm; in contrast, SrIrO 3 thin films with thickness thicker than 30 nm are composed of both meta-stable orthorhombic and stable monoclinic SrIrO 3 phases, and show polycrystalline quality. The interfacial structure and crystalline domain structure of orthorhombic SrIrO 3 thin films are characterized. The formation of meta-stable orthorhombic SrIrO 3 thin films is discussed by strain between substrates and thin films on the basis of the Gibbs formation energy difference between monoclinic and orthorhombic SrIrO 3 phases. Stabilization of meta-stable orthorhombic SrIrO 3 with single crystalline quality provides an ideal system to elucidate the intrinsic physical property of SrIrO 3 . Crown",

keywords = "Thermodynamics, Thin films, Transmission electron microscopy",

author = "Lunyong Zhang and Wu, \{Hong Yan\} and Jian Zhou and Wu, \{Fei Xiang\} and Chen, \{Y. B.\} and Yao, \{Shu Hua\} and Zhang, \{Shan Tao\} and Chen, \{Yan Feng\}",

year = "2013",

month = sep,

day = "1",

doi = "10.1016/j.apsusc.2013.04.150",

language = "英语",

volume = "280",

pages = "282--286",

journal = "Applied Surface Science",

issn = "0169-4332",

publisher = "Elsevier B.V.",

}

Zhang, L, Wu, HY, Zhou, J, Wu, FX, Chen, YB, Yao, SH, Zhang, ST & Chen, YF 2013, ' TEM study of SrIrO ₃ thin films with various thicknesses grown on (0 0 1) SrTiO ₃ substrates synthesized by pulsed laser deposition ', Applied Surface Science, vol. 280, pp. 282-286. https://doi.org/10.1016/j.apsusc.2013.04.150

TEM study of SrIrO ₃ thin films with various thicknesses grown on (0 0 1) SrTiO ₃ substrates synthesized by pulsed laser deposition . / Zhang, Lunyong; Wu, Hong Yan; Zhou, Jian et al.
In: Applied Surface Science, Vol. 280, 01.09.2013, p. 282-286.

Research output: Contribution to journal › Article › peer-review

TY - JOUR

T1 - TEM study of SrIrO 3 thin films with various thicknesses grown on (0 0 1) SrTiO 3 substrates synthesized by pulsed laser deposition

AU - Zhang, Lunyong

AU - Wu, Hong Yan

AU - Zhou, Jian

AU - Wu, Fei Xiang

AU - Chen, Y. B.

AU - Yao, Shu Hua

AU - Zhang, Shan Tao

AU - Chen, Yan Feng

PY - 2013/9/1

Y1 - 2013/9/1

N2 - The microstructure of SrIrO 3 thin films with various thicknesses is characterized by transmission electron microscopy. We observed that the SrIrO 3 thin films are formed in meta-stable orthorhombic structure and demonstrate the single-crystalline quality when the thickness is thinner than 30 nm; in contrast, SrIrO 3 thin films with thickness thicker than 30 nm are composed of both meta-stable orthorhombic and stable monoclinic SrIrO 3 phases, and show polycrystalline quality. The interfacial structure and crystalline domain structure of orthorhombic SrIrO 3 thin films are characterized. The formation of meta-stable orthorhombic SrIrO 3 thin films is discussed by strain between substrates and thin films on the basis of the Gibbs formation energy difference between monoclinic and orthorhombic SrIrO 3 phases. Stabilization of meta-stable orthorhombic SrIrO 3 with single crystalline quality provides an ideal system to elucidate the intrinsic physical property of SrIrO 3 . Crown

AB - The microstructure of SrIrO 3 thin films with various thicknesses is characterized by transmission electron microscopy. We observed that the SrIrO 3 thin films are formed in meta-stable orthorhombic structure and demonstrate the single-crystalline quality when the thickness is thinner than 30 nm; in contrast, SrIrO 3 thin films with thickness thicker than 30 nm are composed of both meta-stable orthorhombic and stable monoclinic SrIrO 3 phases, and show polycrystalline quality. The interfacial structure and crystalline domain structure of orthorhombic SrIrO 3 thin films are characterized. The formation of meta-stable orthorhombic SrIrO 3 thin films is discussed by strain between substrates and thin films on the basis of the Gibbs formation energy difference between monoclinic and orthorhombic SrIrO 3 phases. Stabilization of meta-stable orthorhombic SrIrO 3 with single crystalline quality provides an ideal system to elucidate the intrinsic physical property of SrIrO 3 . Crown

KW - Thermodynamics

KW - Thin films

KW - Transmission electron microscopy

UR - https://www.scopus.com/pages/publications/84879694553

U2 - 10.1016/j.apsusc.2013.04.150

DO - 10.1016/j.apsusc.2013.04.150

M3 - 文章

AN - SCOPUS:84879694553

SN - 0169-4332

VL - 280

SP - 282

EP - 286

JO - Applied Surface Science

JF - Applied Surface Science

ER -

Zhang L, Wu HY, Zhou J, Wu FX, Chen YB, Yao SH et al. TEM study of SrIrO ₃ thin films with various thicknesses grown on (0 0 1) SrTiO ₃ substrates synthesized by pulsed laser deposition Applied Surface Science. 2013 Sep 1;280:282-286. doi: 10.1016/j.apsusc.2013.04.150

TEM study of SrIrO ₃ thin films with various thicknesses grown on (0 0 1) SrTiO ₃ substrates synthesized by pulsed laser deposition

Abstract

Keywords

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