@inproceedings{c5de707e4a704a74aaccf6323ecd5924,
title = "TCAD simulation of single event effects induced by pulsed laser",
abstract = "In this paper, the laser radiation model is built up with TCAD (Technology Computer Aided Design) tool. And a PN junction is chosen for simulating the Single Event Effects (SEEs) induced by the pulsed laser as well as heavy ions. The transient current responses related with SEEs are simulated, and also the distributions of the electrostatic potential and carrier generation inside the device are plotted. Simulation results demonstrate that the pulsed laser can simulate single event effects effectively in spite of the different mechanisms responsible for generating electron-hole pairs between pulsed laser and heavy ions. And it is indicated that the pulsed laser simulation with TCAD is significant for the laser experiments.",
keywords = "TCAD, heavy ions, pulsed laser, single event effects",
author = "Jie Li and Liyi Xiao and Chunhua Qi and Hongchen Li",
note = "Publisher Copyright: {\textcopyright} 2017 IEEE.; 8th IEEE Prognostics and System Health Management Conference, PHM-Harbin 2017 ; Conference date: 09-07-2017 Through 12-07-2017",
year = "2017",
month = oct,
day = "20",
doi = "10.1109/PHM.2017.8079236",
language = "英语",
series = "2017 Prognostics and System Health Management Conference, PHM-Harbin 2017 - Proceedings",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
editor = "Bin Zhang and Yu Peng and Haitao Liao and Datong Liu and Shaojun Wang and Qiang Miao",
booktitle = "2017 Prognostics and System Health Management Conference, PHM-Harbin 2017 - Proceedings",
address = "美国",
}