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Task-guided dynamic feature selection and loss optimization for multi-scale defect detection

  • Pengfei Liu
  • , Guangming Xia
  • , Fang Li
  • , Yuhan Guo
  • , Shuxian Shang
  • , Yuetong Chang
  • , Han Feng
  • , Biwei Wu
  • , Weibo Wang*
  • *Corresponding author for this work
  • Harbin Institute of Technology
  • Nanyang Technological University
  • FAW Group Corporation
  • School of Management, Harbin Institute of Technology

Research output: Contribution to journalArticlepeer-review

Abstract

Multi-level features with varying extraction degrees are crucial for detecting multi-scale defects. However, most existing detectors rely on handcrafted heuristics (e.g., IoU) to select positive samples from feature pyramids, which are inherently task-agnostic and unaware of prediction quality. In this paper, we introduce a T ask- G uided dynamic F eature S election (TGFS) strategy, which leverages task-driven classification and localization losses to quantitatively evaluate the matching quality between each ground-truth instance and candidate positive samples across different feature layers during each training epoch. Based on these layer-wise quality scores, each ground-truth dynamically selects positive samples from the first three feature layers that offer the most optimal task-specific representation. To further enhance training effectiveness, we design a non-linear loss reweighting function that adjusts the contribution of the selected samples to the total loss, thereby improving the model’s learning of multi-scale features and enhancing training efficiency. We implement the proposed method on a lightweight, anchor-free FCOS baseline with zero inference overhead. Experimental results demonstrate that our approach achieves competitive performance, reaching 80.7 mAP on the NEU-DET dataset and 70.0 mAP on the GC10-DET dataset.

Original languageEnglish
Article number104772
JournalAdvanced Engineering Informatics
Volume74
DOIs
StatePublished - Sep 2026

Keywords

  • AI in industrial
  • Intelligent manufacturing
  • Surface defect detection

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