Abstract
The GaN powders were synthesized by the reaction of Ga2O3 and Li3N and scanning transmission electron microscopy (STEM) analysis showed the as-prepared GaN were N-deficient with the N vacancies reaching as much as 21%. Besides single-phase of the hexagonal GaN, no other phase from impurities can be detected under the high-resolution transmission electron microscopy (HRTEM) observations. The room temperature (RT) frequency spectrums of the relative dielectric constants εr were measured and the N-deficient GaN exhibited at least twofold enhancement than that of GaN nanostructure materials, especially at low frequency range. Because of the great number of N vacancies (VN), the rotation direction polarization (RDP) contributes mostly for the enhancement of εr in N-deficient GaN.
| Original language | English |
|---|---|
| Pages (from-to) | 31-35 |
| Number of pages | 5 |
| Journal | Journal of Alloys and Compounds |
| Volume | 460 |
| Issue number | 1-2 |
| DOIs | |
| State | Published - 28 Jul 2008 |
| Externally published | Yes |
Keywords
- Dielectric response
- Semiconductors
- Solid state reactions
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