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Super-resolution and super-sensitivity of entangled squeezed vacuum state using optimal detection strategy

  • Jiandong Zhang*
  • , Zijing Zhang
  • , Longzhu Cen
  • , Shuo Li
  • , Yuan Zhao
  • , Feng Wang
  • *Corresponding author for this work
  • Harbin Institute of Technology
  • Tianjin University of Technology

Research output: Contribution to journalArticlepeer-review

Abstract

Interference metrology is a method for achieving high precision detection by phase estimation. The phase sensitivity of a traditional interferometer is subject to the standard quantum limit, while its resolution is constrained by the Rayleigh diffraction limit. The resolution and sensitivity of phase measurement can be enhanced by using quantum metrology. We propose a quantum interference metrology scheme using the entangled squeezed vacuum state, which is obtained using the magic beam splitter, expressed as |ψ〉 = (|Ξ〉 |0〉 +|0〉 |Ξ 〉)/√ 2+2/coshr, such as the N00N state. We derive the phase sensitivity and the resolution of the system with Z detection, project detection, and parity detection. By simulation and analysis, we determine that parity detection is an optimal detection method, which can break through the Rayleigh diffraction limit and the standard quantum limit.

Original languageEnglish
Article number094204
JournalChinese Physics B
Volume26
Issue number9
DOIs
StatePublished - Aug 2017

Keywords

  • entangled squeezed vacuum state
  • parity detection
  • quantum metrology

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