TY - GEN
T1 - Subspace Model Based Discriminative Instances Selection for Weakly Supervised Object Detection
AU - Huang, Qiaoying
AU - Zhang, Xiaofeng
AU - Jia, Kui
AU - Han, Xishuang
AU - Ye, Yunming
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2016/1/29
Y1 - 2016/1/29
N2 - Object detection from images is generally achieved through a supervised learning manner. However, in many real applications, to provide instance level label is still costly. Thus, weakly supervised approach is proposed and naturally cast as a Multiple Instance Learning (MIL) problem. Traditional MIL methods typically learn discriminative classifiers from positive and negative training bags. Alternatively, we propose to select more discriminative instances for learning classifiers to further improve detection accuracy. With the candidate set of positive instances, we can also train a Smoothing Latent Support Vector Machine (SLSVM) to finally detect objects from a bag of instances. We observed that object instances of a common category are visually similar and when characterized as highdimensional feature representations, they approximately lie in a low-dimensional subspace. Therefore, we propose a formulation optimizes a labeling variable for each positive image and learns the subspace model by minimizing rank (via convex surrogate function) of the coefficient matrix associated with the subspace model. To improve discriminative power, we also promote incoherence between the subspace model and some "hard" negative instances by utilizing a ϵ-insensitive loss. For this non-convex problem, we resort to block coordinate descent and Alternating Direction Method of Multipliers(ADMM) to get local optimal solutions. The promising empirical studies on real data sets demonstrate that our proposed method is superior to the stateof-the-art weakly supervised object detection approaches.
AB - Object detection from images is generally achieved through a supervised learning manner. However, in many real applications, to provide instance level label is still costly. Thus, weakly supervised approach is proposed and naturally cast as a Multiple Instance Learning (MIL) problem. Traditional MIL methods typically learn discriminative classifiers from positive and negative training bags. Alternatively, we propose to select more discriminative instances for learning classifiers to further improve detection accuracy. With the candidate set of positive instances, we can also train a Smoothing Latent Support Vector Machine (SLSVM) to finally detect objects from a bag of instances. We observed that object instances of a common category are visually similar and when characterized as highdimensional feature representations, they approximately lie in a low-dimensional subspace. Therefore, we propose a formulation optimizes a labeling variable for each positive image and learns the subspace model by minimizing rank (via convex surrogate function) of the coefficient matrix associated with the subspace model. To improve discriminative power, we also promote incoherence between the subspace model and some "hard" negative instances by utilizing a ϵ-insensitive loss. For this non-convex problem, we resort to block coordinate descent and Alternating Direction Method of Multipliers(ADMM) to get local optimal solutions. The promising empirical studies on real data sets demonstrate that our proposed method is superior to the stateof-the-art weakly supervised object detection approaches.
KW - Low rank
KW - Multiple instance learning
KW - Subspace model learning
KW - weakly supervised learning
UR - https://www.scopus.com/pages/publications/84964773888
U2 - 10.1109/ICDMW.2015.135
DO - 10.1109/ICDMW.2015.135
M3 - 会议稿件
AN - SCOPUS:84964773888
T3 - Proceedings - 15th IEEE International Conference on Data Mining Workshop, ICDMW 2015
SP - 1514
EP - 1521
BT - Proceedings - 15th IEEE International Conference on Data Mining Workshop, ICDMW 2015
A2 - Wu, Xindong
A2 - Tuzhilin, Alexander
A2 - Xiong, Hui
A2 - Dy, Jennifer G.
A2 - Aggarwal, Charu
A2 - Zhou, Zhi-Hua
A2 - Cui, Peng
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 15th IEEE International Conference on Data Mining Workshop, ICDMW 2015
Y2 - 14 November 2015 through 17 November 2015
ER -