Subatomic imaging of Si (001) surface by molecular dynamic simulation

Yingchun Liang; Jianhua Dou; Qingshun Bai; Shumei Wang; Mingjun Chen; Yan Zhao; Shen Dong

doi:10.1109/NEMS.2006.334670

Subatomic imaging of Si (001) surface by molecular dynamic simulation

Yingchun Liang
, Jianhua Dou^*
, Qingshun Bai
, Shumei Wang
, Mingjun Chen
, Yan Zhao
, Shen Dong

^*Corresponding author for this work

School of Mechatronics Engineering

Harbin Institute of Technology
Daqing Normal University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

Abstract

In this study we predict the frequency modulation atomic force microscopy (FM-AFM) subatomic frequency shift images of a Si (001) surface using empirical potential molecular dynamic methods. We model Carbon single-wall nanotube caped tip and Si (001) surface to investigate the tip-surface interaction. The simulation shows that the FM-AFM imaging force mainly comes from C-Si/C-C chemical covalent bonding forces; the long range nonbond Van der Waals forces are slight and can be ignored.

Original language	English
Title of host publication	Proceedings of 1st IEEE International Conference on Nano Micro Engineered and Molecular Systems, 1st IEEE-NEMS
Pages	1156-1159
Number of pages	4
DOIs	https://doi.org/10.1109/NEMS.2006.334670
State	Published - 2006
Event	1st IEEE International Conference on Nano Micro Engineered and Molecular Systems, 1st IEEE-NEMS - Zhuhai, China Duration: 18 Jan 2006 → 21 Jan 2006

Publication series

Name	Proceedings of 1st IEEE International Conference on Nano Micro Engineered and Molecular Systems, 1st IEEE-NEMS

Conference

Conference	1st IEEE International Conference on Nano Micro Engineered and Molecular Systems, 1st IEEE-NEMS
Country/Territory	China
City	Zhuhai
Period	18/01/06 → 21/01/06

Keywords

Carbon nanotube
Imaging
Molecular dynamic simulation

Access to Document

10.1109/NEMS.2006.334670

Cite this

Liang, Y., Dou, J., Bai, Q., Wang, S., Chen, M., Zhao, Y., & Dong, S. (2006). Subatomic imaging of Si (001) surface by molecular dynamic simulation. In Proceedings of 1st IEEE International Conference on Nano Micro Engineered and Molecular Systems, 1st IEEE-NEMS (pp. 1156-1159). Article 4135152 (Proceedings of 1st IEEE International Conference on Nano Micro Engineered and Molecular Systems, 1st IEEE-NEMS). https://doi.org/10.1109/NEMS.2006.334670

Liang, Yingchun ; Dou, Jianhua ; Bai, Qingshun et al. / Subatomic imaging of Si (001) surface by molecular dynamic simulation. Proceedings of 1st IEEE International Conference on Nano Micro Engineered and Molecular Systems, 1st IEEE-NEMS. 2006. pp. 1156-1159 (Proceedings of 1st IEEE International Conference on Nano Micro Engineered and Molecular Systems, 1st IEEE-NEMS).

@inproceedings{60b56d77c3fd46a68970fc37e783e290,

title = "Subatomic imaging of Si (001) surface by molecular dynamic simulation",

abstract = "In this study we predict the frequency modulation atomic force microscopy (FM-AFM) subatomic frequency shift images of a Si (001) surface using empirical potential molecular dynamic methods. We model Carbon single-wall nanotube caped tip and Si (001) surface to investigate the tip-surface interaction. The simulation shows that the FM-AFM imaging force mainly comes from C-Si/C-C chemical covalent bonding forces; the long range nonbond Van der Waals forces are slight and can be ignored.",

keywords = "Carbon nanotube, Imaging, Molecular dynamic simulation",

author = "Yingchun Liang and Jianhua Dou and Qingshun Bai and Shumei Wang and Mingjun Chen and Yan Zhao and Shen Dong",

year = "2006",

doi = "10.1109/NEMS.2006.334670",

language = "英语",

isbn = "1424401402",

series = "Proceedings of 1st IEEE International Conference on Nano Micro Engineered and Molecular Systems, 1st IEEE-NEMS",

pages = "1156--1159",

booktitle = "Proceedings of 1st IEEE International Conference on Nano Micro Engineered and Molecular Systems, 1st IEEE-NEMS",

note = "1st IEEE International Conference on Nano Micro Engineered and Molecular Systems, 1st IEEE-NEMS ; Conference date: 18-01-2006 Through 21-01-2006",

}

Liang, Y, Dou, J, Bai, Q, Wang, S, Chen, M, Zhao, Y & Dong, S 2006, Subatomic imaging of Si (001) surface by molecular dynamic simulation. in Proceedings of 1st IEEE International Conference on Nano Micro Engineered and Molecular Systems, 1st IEEE-NEMS., 4135152, Proceedings of 1st IEEE International Conference on Nano Micro Engineered and Molecular Systems, 1st IEEE-NEMS, pp. 1156-1159, 1st IEEE International Conference on Nano Micro Engineered and Molecular Systems, 1st IEEE-NEMS, Zhuhai, China, 18/01/06. https://doi.org/10.1109/NEMS.2006.334670

Subatomic imaging of Si (001) surface by molecular dynamic simulation. / Liang, Yingchun; Dou, Jianhua; Bai, Qingshun et al.
Proceedings of 1st IEEE International Conference on Nano Micro Engineered and Molecular Systems, 1st IEEE-NEMS. 2006. p. 1156-1159 4135152 (Proceedings of 1st IEEE International Conference on Nano Micro Engineered and Molecular Systems, 1st IEEE-NEMS).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Subatomic imaging of Si (001) surface by molecular dynamic simulation

AU - Liang, Yingchun

AU - Dou, Jianhua

AU - Bai, Qingshun

AU - Wang, Shumei

AU - Chen, Mingjun

AU - Zhao, Yan

AU - Dong, Shen

PY - 2006

Y1 - 2006

N2 - In this study we predict the frequency modulation atomic force microscopy (FM-AFM) subatomic frequency shift images of a Si (001) surface using empirical potential molecular dynamic methods. We model Carbon single-wall nanotube caped tip and Si (001) surface to investigate the tip-surface interaction. The simulation shows that the FM-AFM imaging force mainly comes from C-Si/C-C chemical covalent bonding forces; the long range nonbond Van der Waals forces are slight and can be ignored.

AB - In this study we predict the frequency modulation atomic force microscopy (FM-AFM) subatomic frequency shift images of a Si (001) surface using empirical potential molecular dynamic methods. We model Carbon single-wall nanotube caped tip and Si (001) surface to investigate the tip-surface interaction. The simulation shows that the FM-AFM imaging force mainly comes from C-Si/C-C chemical covalent bonding forces; the long range nonbond Van der Waals forces are slight and can be ignored.

KW - Carbon nanotube

KW - Imaging

KW - Molecular dynamic simulation

UR - https://www.scopus.com/pages/publications/46149124774

U2 - 10.1109/NEMS.2006.334670

DO - 10.1109/NEMS.2006.334670

M3 - 会议稿件

AN - SCOPUS:46149124774

SN - 1424401402

SN - 9781424401406

T3 - Proceedings of 1st IEEE International Conference on Nano Micro Engineered and Molecular Systems, 1st IEEE-NEMS

SP - 1156

EP - 1159

BT - Proceedings of 1st IEEE International Conference on Nano Micro Engineered and Molecular Systems, 1st IEEE-NEMS

T2 - 1st IEEE International Conference on Nano Micro Engineered and Molecular Systems, 1st IEEE-NEMS

Y2 - 18 January 2006 through 21 January 2006

ER -

Liang Y, Dou J, Bai Q, Wang S, Chen M, Zhao Y et al. Subatomic imaging of Si (001) surface by molecular dynamic simulation. In Proceedings of 1st IEEE International Conference on Nano Micro Engineered and Molecular Systems, 1st IEEE-NEMS. 2006. p. 1156-1159. 4135152. (Proceedings of 1st IEEE International Conference on Nano Micro Engineered and Molecular Systems, 1st IEEE-NEMS). doi: 10.1109/NEMS.2006.334670

Subatomic imaging of Si (001) surface by molecular dynamic simulation

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