Skip to main navigation Skip to search Skip to main content

Sub-microscale precision repeatability position measurement using integrated polar microstructure and feature extraction method

  • Chenyang Zhao
  • , Jie Xiang
  • , Chi Fai Cheung*
  • *Corresponding author for this work
  • Harbin Institute of Technology Shenzhen
  • Hong Kong Polytechnic University
  • HIT-PolyU Key Laboratory of Ultra-precision Measurement and Instruments

Research output: Contribution to journalArticlepeer-review

Abstract

This paper presents a novel vision-based way to achieve repeatability measurement with sub-microscale precision, two degrees of freedom, small footprint, easy installation, and low cost. This research theoretically analyzes the pixel intensity distribution mechanism of surface topography and develops the non-periodic pattern referred to be polar microstructure to achieve sub-microscale resolution. Considering polar microstructure features, this paper also develops an image matching-based measurement algorithm, leading to the integrated polar microstructure and feature extraction (PMFE) repeatability measurement method. To demonstrate the performance of PMFE, comparison experiments with the laser interferometer method were conducted. The experimental results show the measurement uncertainty of the PMFE method is 0.58 μm in the X direction and 0.33 μm in the Y direction respectively compared with the laser interferometer method. These results indicate that the PMFE system is reliable and show the potential application in the measurement of machine tool repeatability. is reliable and show the potential application in the measurement of machine tool repeatability.

Original languageEnglish
Article number113254
JournalMeasurement: Journal of the International Measurement Confederation
Volume218
DOIs
StatePublished - 15 Aug 2023
Externally publishedYes

Keywords

  • Computer vision
  • Machine tool
  • Precision surface measurement
  • Repeatability measurement
  • Surface microstructure

Fingerprint

Dive into the research topics of 'Sub-microscale precision repeatability position measurement using integrated polar microstructure and feature extraction method'. Together they form a unique fingerprint.

Cite this