@inproceedings{0de2f573d237490996bf6fce27ef4429,
title = "Study on molecular dynamics simulation of tungsten microelectrode based on single discharge in EDM",
abstract = "In this paper, in order to understand the mechanism of the microelectrode self-sharpening phenomenon in single discharge, molecular dynamics (MD) computer simulation is carried out. From the simulation result we find that during tungsten microelectrode self-sharpening process, single atom removing and bulk atom cluster removing both exist. Electric field force is a key factor for microelectrode shape forming. Heating rate (pulse duration) influences the shape of microelectrode largely, a optimum conditions in pulse duration and discharge current exist for microelectrode self-sharpening depending on the thermal conductivity and diameter of electrode.",
keywords = "EDM, Microelectrode, Molecular dynamics simulation, Single discharge",
author = "Wang, \{Z. L.\} and Cui, \{J. Z.\} and Cao, \{G. H.\}",
year = "2006",
language = "英语",
isbn = "095806928X",
series = "Current Development in Abrasive Technology - Proceedings of the 9th International Symposium on Advances in Abrasive Technology, ISAAT 2006",
pages = "543--548",
booktitle = "Current Development in Abrasive Technology - Proceedings of the 9th International Symposium on Advances in Abrasive Technology, ISAAT 2006",
note = "9th International Symposium on Advances in Abrasive Technology: Current Development in Abrasive Technology, ISAAT 2006 ; Conference date: 26-09-2006 Through 29-09-2006",
}