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Study on microstructure formation of TiAl based micro-laminates deposited by EB-PVD

  • Gu Ping Wang
  • , Li Ma*
  • *Corresponding author for this work
  • TaiZhou University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

TiAl based micro-laminated sheet was deposited by electron beam physical vapor deposition (EB-PVD) with dual-target in this work, and then the microstructure and phase analysis of as-deposited samples were studied by SEM, XRD and TEM. The results show that the difference of melting points between Ti and Al led to the distinctive structure: the Ti-Al layers were mainly constituted of equiaxed grains and Ti layers were constituted of column grains. Because of the deviation of saturated vapor pressure between Ti and Al element, the component showed a gradient change periodically along the normal direction of Ti-Al layers and results in several sub-layers. The Ti layers, Ti-Al layers and interfacial layers were constituted of α phase, γ+α2 phase and α2 phase respectively.

Original languageEnglish
Title of host publicationAdvanced Materials and Processes IV
EditorsJianzhong Lin, Tianhong Yan, Jingwei Zhao, Xinsheng Xu, Zhengyi Jiang
PublisherTrans Tech Publications Ltd
Pages422-426
Number of pages5
ISBN (Electronic)9783038352563
DOIs
StatePublished - 2014
Externally publishedYes
Event4th International Conference on Advanced Design and Manufacturing Engineering, ADME 2014 - Hangzhou, China
Duration: 26 Jul 201427 Jul 2014

Publication series

NameApplied Mechanics and Materials
Volume633-634
ISSN (Print)1660-9336
ISSN (Electronic)1662-7482

Conference

Conference4th International Conference on Advanced Design and Manufacturing Engineering, ADME 2014
Country/TerritoryChina
CityHangzhou
Period26/07/1427/07/14

Keywords

  • EB-PVD
  • Microlaminate
  • Microstructure
  • TiAl

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