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Study on microstructure and dielectric properties of aluminum nitride ceramics

  • Xiulan He*
  • , Lei Shi
  • , Yingkui Guo
  • , Junwang Liu
  • , Feng Ye
  • *Corresponding author for this work
  • Harbin University of Science and Technology

Research output: Contribution to journalArticlepeer-review

Abstract

Abstract Aluminum nitride (AlN) ceramics were sintered with spark plasma sintering (SPS) technique using Y2O3 (Sm2O3)-CaF2 as the sintering additives. The purification effect of sintering additives, dielectric properties, microstructure and polarization mechanism of AlN ceramics were investigated. The densification process curves indicate that both sintering additive and special SPS sintering mechanism are conductive to reducing the sintering beginning temperature. The results of lattice parameters of AlN ceramics suggest that suitable sintering additives have prominent purification effect on the crystal lattice of AlN ceramics. Dielectric constant increases with Y2O3 (Sm2O3) content increasing, and the AlN ceramic containing 2 wt.% Sm2O3-1 wt.% CaF2 exhibits the lowest dielectric loss. Oxygen impurities, dislocation and amorphous layer in the crystal structure of AlN ceramics increase dielectric loss of AlN ceramics. The space charge polarization caused by secondary phases and other defects might be the main polarization mechanism of AlN ceramics.

Original languageEnglish
Article number7941
Pages (from-to)404-410
Number of pages7
JournalMaterials Characterization
Volume106
DOIs
StatePublished - 6 Jul 2015

Keywords

  • AlN ceramics
  • Dielectric property
  • Microstructure
  • Sintering

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