TY - GEN
T1 - Study on KPI-related subspace decomposition for fault detection and robust KPI prediction against abnormal data
AU - Jiang, Yuchen
AU - Yu, Han
AU - Yin, Jiapeng
AU - Yang, Chengming
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2016/11/17
Y1 - 2016/11/17
N2 - This paper deals with key performance indicator (KPI) related fault detection system design issues based on an integrated framework. The characteristics of the projection directions and the extracted subspaces are discussed in details. In comparison with the basic PLS based approach, the proposed algorithm improves the decomposition performance with respect to KPI. In the meantime, by incorporating the partial robust M-regression (PRM) algorithm into the expectation maximum (EM) framework, abnormal data including outliers and missing data are carefully dealt with. At last, a demonstration on the industrial benchmark, the Tennessee Eastman process (TEP) is provided to verify the validity and superiority of the proposed method.
AB - This paper deals with key performance indicator (KPI) related fault detection system design issues based on an integrated framework. The characteristics of the projection directions and the extracted subspaces are discussed in details. In comparison with the basic PLS based approach, the proposed algorithm improves the decomposition performance with respect to KPI. In the meantime, by incorporating the partial robust M-regression (PRM) algorithm into the expectation maximum (EM) framework, abnormal data including outliers and missing data are carefully dealt with. At last, a demonstration on the industrial benchmark, the Tennessee Eastman process (TEP) is provided to verify the validity and superiority of the proposed method.
UR - https://www.scopus.com/pages/publications/85001075440
U2 - 10.1109/ISIE.2016.7744873
DO - 10.1109/ISIE.2016.7744873
M3 - 会议稿件
AN - SCOPUS:85001075440
T3 - IEEE International Symposium on Industrial Electronics
SP - 100
EP - 105
BT - Proceedings - 2016 IEEE 25th International Symposium on Industrial Electronics, ISIE 2016
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 25th IEEE International Symposium on Industrial Electronics, ISIE 2016
Y2 - 8 June 2016 through 10 June 2016
ER -