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Study on infrared thermal wave inspection technology using linear frequency modulated (LFM) light excitation

  • Liqiang Liu*
  • , Junyan Liu
  • , Yang Wang
  • *Corresponding author for this work
  • Jiamusi University
  • School of Mechatronics Engineering, Harbin Institute of Technology

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

This paper provides the theory, mathematics analysis and experiments in support of the Infrared thermal-wave inspection on the subsurface defects in a solid using linear frequency modulated light excitation (LFMTWI). The specimen is heated by the heat flux of linear frequency modulation for launching thermal-wave into the sample in a desired range of frequency. The more thermal wave responses characters are obtained, and the IR thermal-wave imaging shows much more advantages for subsurface defects detection. The simulation and experimental results from steel sample are presented in support of this technique.

Original languageEnglish
Title of host publicationAutomatic Manufacturing Systems II
Pages659-662
Number of pages4
DOIs
StatePublished - 2012
Externally publishedYes
Event2nd International Conference on Advanced Engineering Materials and Technology, AEMT 2012 - Zhuhai, China
Duration: 6 Jul 20128 Jul 2012

Publication series

NameAdvanced Materials Research
Volume542-543
ISSN (Print)1022-6680

Conference

Conference2nd International Conference on Advanced Engineering Materials and Technology, AEMT 2012
Country/TerritoryChina
CityZhuhai
Period6/07/128/07/12

Keywords

  • Cross-correlation
  • Infrared imaging
  • Linear modulation frequency

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