Study on image automatic aiming system

Automation and intelligent function in aiming of optical instrument are the key problems in modern instrument design. A new image automatic aiming system is proposed. The automatic aiming for profile of the measured part is carried out by means of ″electronic sight″ techniques and sub-pixel level subdivision techniques. The system has been successfully applied to image processing for universal tool-measuring microscope, its upgrading and reforming. The measuring accuracy of the universal tool-measuring microscope can be improved for an order of magnitude and at the same time its original function can be expanded. The method can also be applied to automatic aiming and measurement of various kind of optical instruments.