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Study morphology evolution in self-assembled block copolymer thin films in virtue of carbon nanotube

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In order to study systemically the morphology evolution in self-assembled block copolymer thin films induced by solution annealing, a simple relocation technique for atomic force microscopy, which takes advantage of carbon nanotube, is used for investigating repeatedly the imaging of some specific species on the whole substrate with a high relocation accuracy of tens of nanometers. As an example of the application of this technique, TappingMode AFM Ex-situ study of the morphology transition induced by solvent treatment in a triblock copolymer thin film has been carried out.

Original languageEnglish
Title of host publicationAdvances in Heterogeneous Material Mechanics 2008 - 2nd International Conference on Heterogeneous Material Mechanics, ICHMM 2008
Pages1358-1361
Number of pages4
StatePublished - 2008
EventAdvances in Heterogeneous Material Mechanics 2008 - 2nd International Conference on Heterogeneous Material Mechanics, ICHMM 2008 - Huangshan, China
Duration: 3 Jun 20088 Jun 2008

Publication series

NameAdvances in Heterogeneous Material Mechanics 2008 - Proceedings of the 2nd International Conference on Heterogeneous Material Mechanics, ICHMM 2008

Conference

ConferenceAdvances in Heterogeneous Material Mechanics 2008 - 2nd International Conference on Heterogeneous Material Mechanics, ICHMM 2008
Country/TerritoryChina
CityHuangshan
Period3/06/088/06/08

Keywords

  • AFM
  • Block copolymer
  • Carbon nanotube
  • Self-assembled

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