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Structured illumination microscopy based on Kramers–Kronig relations for quantitative phase reconstruction

  • Yiran Wang
  • , Yutong Li
  • , Ziyang Li
  • , Xuyang Zhou
  • , Yu Ji
  • , Gangshan Liu
  • , Pengtao Zhao
  • , Shurui Yang
  • , Zhengjun Liu*
  • , Shutian Liu
  • *Corresponding author for this work
  • School of Physics, Harbin Institute of Technology

Research output: Contribution to journalArticlepeer-review

Abstract

Structured illumination microscopy (SIM) is a widely applied fluorescence super-resolution imaging technique. It can also serve as high-throughput imaging in coherent imaging systems. However, coherent SIM requires additional qualitative/quantitative phase imaging methods to acquire phase information. This paper proposes a structured illumination microscopy technique based on the Kramers–Kronig relations (KK-SIM) that achieves quantitative phase imaging without the need for extra technical assistance and relies solely on the spatial-domain intensity images reconstructed through conventional SIM. KK-SIM utilizes a non-iterative approach to recover intensity into amplitude and phase, maintaining SIM’s high acquisition speed and reconstruction efficiency. Our work enables high-throughput quantitative phase imaging using conventional SIM experimental setups and data post-processing, making SIM suitable for label-free, noninvasive dynamic observation.

Original languageEnglish
Pages (from-to)6801-6804
Number of pages4
JournalOptics Letters
Volume49
Issue number23
DOIs
StatePublished - 1 Dec 2024
Externally publishedYes

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