Abstract
Structured illumination microscopy (SIM) is a widely applied fluorescence super-resolution imaging technique. It can also serve as high-throughput imaging in coherent imaging systems. However, coherent SIM requires additional qualitative/quantitative phase imaging methods to acquire phase information. This paper proposes a structured illumination microscopy technique based on the Kramers–Kronig relations (KK-SIM) that achieves quantitative phase imaging without the need for extra technical assistance and relies solely on the spatial-domain intensity images reconstructed through conventional SIM. KK-SIM utilizes a non-iterative approach to recover intensity into amplitude and phase, maintaining SIM’s high acquisition speed and reconstruction efficiency. Our work enables high-throughput quantitative phase imaging using conventional SIM experimental setups and data post-processing, making SIM suitable for label-free, noninvasive dynamic observation.
| Original language | English |
|---|---|
| Pages (from-to) | 6801-6804 |
| Number of pages | 4 |
| Journal | Optics Letters |
| Volume | 49 |
| Issue number | 23 |
| DOIs | |
| State | Published - 1 Dec 2024 |
| Externally published | Yes |
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