Abstract
Nanosized Fe3-doped SnO2 thin film was prepared by the solgel dip coating (SGDC) technique on quartz class substrate and sintered at 800 °C. The microstructures, surface morphology and optical properties of these films were then characterized by means of X-ray diffraction (XRD), scanning electron microscopy (SEM) and optical absorption measurements, respectively. Electrical properties were analyzed, and resistivity, type and number of carrier concentration, Hall mobility measured as a function of Fe 3 doping and temperature. The XRD spectrum shows the decrease in peak heights as a result of Fe3-doping while SEM images reveal reduction in crystallite size with increase in Fe3 content. The optical studies showed a direct band gap reducing with increase in Fe3-doping from 3.87 to 3.38 eV. From the electrical measurements, it was found that the resistivity initially increased with Fe3-doping before reducing at higher doping level. Hall mobility measurements showed n-type conductivity at lower Fe3-doping levels and p-type at higher levels. The increase in conductivity with temperature ascertained the semiconducting behavior of these films.
| Original language | English |
|---|---|
| Pages (from-to) | 125-131 |
| Number of pages | 7 |
| Journal | Materials Science in Semiconductor Processing |
| Volume | 13 |
| Issue number | 3 |
| DOIs | |
| State | Published - Sep 2010 |
Keywords
- Fe-doped SnO thin film
- Microstructural
- Optical and electrical properties
- Solgel dip coating
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