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Stress-free two-way thermoelastic shape memory and field-enhanced strain in Ni52Mn24Ga24 single crystals

  • W. H. Wang*
  • , G. H. Wu
  • , J. L. Chen
  • , C. H. Yu
  • , S. X. Gao
  • , W. S. Zhan
  • , Z. Wang
  • , Z. Y. Gao
  • , Y. F. Zheng
  • , L. C. Zhao
  • *Corresponding author for this work
  • CAS - Institute of Physics
  • Harbin Institute of Technology

Research output: Contribution to journalArticlepeer-review

Abstract

Stress-free and two-way thermoelastic shape memory, with 1.2% strain and 6 K temperature hysteresis, has been found in single crystalline Ni52Mn24Ga24. The deformation can be enhanced more than three times, up to 4.0% shrinkage with a bias field 1.2 T applied along the measurement direction, or changed to 1.5% expansion by the 1.2 T applied perpendicular to the measurement direction. For achieving a large deformation, the magnetic field exhibits a more evident contribution than an external stress on this material. These characteristics can be attributed to the low level of internal stress and the preferential orientation of the martensitic variants.

Original languageEnglish
Pages (from-to)3245-3247
Number of pages3
JournalApplied Physics Letters
Volume77
Issue number20
DOIs
StatePublished - 13 Nov 2000
Externally publishedYes

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