Abstract
This paper reports the evolutions of stress and mechanical properties of tetrahedral amorphous carbon films upon boron incorporation. A sharp stress relief and slight density reduction combined with moderate hardness and Young's modulus were observed for the films with boron concentration up to 15% in the cathodes. Raman spectroscopy shows that a clustering of sp2 sites without a notable decrease in sp3 content occurs in the films, which is responsible for the mechanical behavior after boron incorporation.
| Original language | English |
|---|---|
| Pages (from-to) | 141-144 |
| Number of pages | 4 |
| Journal | Scripta Materialia |
| Volume | 57 |
| Issue number | 2 |
| DOIs | |
| State | Published - Jul 2007 |
Keywords
- Amorphous materials
- Mechanical properties
- Raman spectroscopy
- Residual stress
- Thin films
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