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Stress evolution of tetrahedral amorphous carbon upon boron incorporation

  • Manlin Tan*
  • , Jiaqi Zhu
  • , Jiecai Han
  • , Xiao Han
  • , Li Niu
  • , Wangshou Chen
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

This paper reports the evolutions of stress and mechanical properties of tetrahedral amorphous carbon films upon boron incorporation. A sharp stress relief and slight density reduction combined with moderate hardness and Young's modulus were observed for the films with boron concentration up to 15% in the cathodes. Raman spectroscopy shows that a clustering of sp2 sites without a notable decrease in sp3 content occurs in the films, which is responsible for the mechanical behavior after boron incorporation.

Original languageEnglish
Pages (from-to)141-144
Number of pages4
JournalScripta Materialia
Volume57
Issue number2
DOIs
StatePublished - Jul 2007

Keywords

  • Amorphous materials
  • Mechanical properties
  • Raman spectroscopy
  • Residual stress
  • Thin films

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