Skip to main navigation Skip to search Skip to main content

Stacking faults and growth mechanism of in Situ TiB whiskers and interface structures in SPSed TiB/Ti (FeMo) composites

  • Harbin Institute of Technology

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In situ TiB whiskers reinforced Ti metal matrix composites have been fabricated by spark plasma sintering (SPS). Microstructure and stacking faults of in situ TiB whiskers in the composites were investigated in detailed by means of scanning electron microscopy (SEM), transmission electron microscopy (TEM) and high-resolution electron microscopy (HREM). The TiB whiskers exhibit a hexagonal shape at the transverse section and grow along the [010]TiB direction. The crystallography planes of the TiB whiskers at transverse section are always of the (100), (101) and (101̄) planes. The interfaces between the in situ TiB and Ti matrix are clean and faceted along (IOO)TíB side. However, small lateral growth steps are observed along (101) and (101̄) planes of TiB. The stacking faults in TiB whiskers are typically with a stacking fault plane of (100)TiB and displacement vectors of 0.5a±0.254c. The formation mechanism of stacking faults has been proposed and verified by HREM observations.

Original languageEnglish
Title of host publicationSupplement to THERMEC 2006, 5th International Conference on PROCESSING and MANUFACTURING OF ADVANCED MATERIALS, THERMEC 2006
PublisherTrans Tech Publications Ltd
Pages936-941
Number of pages6
EditionPART 1
ISBN (Print)0878494286, 9780878494286
DOIs
StatePublished - 2007
Externally publishedYes
Event5th International Conference on Processing and Manufacturing of Advanced Materials - THERMEC'2006 - Vancouver, Canada
Duration: 4 Jul 20068 Jul 2006

Publication series

NameMaterials Science Forum
NumberPART 1
Volume539-543
ISSN (Print)0255-5476
ISSN (Electronic)1662-9752

Conference

Conference5th International Conference on Processing and Manufacturing of Advanced Materials - THERMEC'2006
Country/TerritoryCanada
CityVancouver
Period4/07/068/07/06

Keywords

  • In situ
  • Interface structure
  • Mechanism
  • Stacking faults
  • TiB whisker

Fingerprint

Dive into the research topics of 'Stacking faults and growth mechanism of in Situ TiB whiskers and interface structures in SPSed TiB/Ti (FeMo) composites'. Together they form a unique fingerprint.

Cite this