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Specific emitter identification using fractal features based on box-counting dimension and variance dimension

  • Longwen Wu
  • , Yaqin Zhao
  • , Zhao Wang
  • , Fakheraldin Y.O. Abdalla
  • , Guanghui Ren
  • School of Electronics and Information Engineering, Harbin Institute of Technology

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Specific emitter identification (SEI) is a technique for distinguishing different emitters of a same type with other weak individual characteristics. Only using some traditional modulation parameters for recognition cannot distinguish different emitters with close modulation parameters. To solve the problem, new complex and high-dimensional features, which can characterize the emitters with more details, urgently need to be developed for recognition. An SEI method using fractal features based on box-counting dimension and variance dimension is presented. This paper mainly focuses on the weak individual characteristics caused by phase noise, applies fractal theory to the feature extraction, and finally establishes the recognition process using support vector machine. Numerical results show that the identification rate is generally more than 95% above 15dB of signal to noise ratio (SNR), and the real data experiment proves the practical performance of the proposed algorithm.

Original languageEnglish
Title of host publication2017 IEEE International Symposium on Signal Processing and Information Technology, ISSPIT 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages226-231
Number of pages6
ISBN (Electronic)9781538646625
DOIs
StatePublished - 18 Jun 2018
Externally publishedYes
Event17th IEEE International Symposium on Signal Processing and Information Technology, ISSPIT 2017 - Bilbao, Spain
Duration: 18 Dec 201720 Dec 2017

Publication series

Name2017 IEEE International Symposium on Signal Processing and Information Technology, ISSPIT 2017

Conference

Conference17th IEEE International Symposium on Signal Processing and Information Technology, ISSPIT 2017
Country/TerritorySpain
CityBilbao
Period18/12/1720/12/17

Keywords

  • box-counting dimension
  • fractal features
  • specific emitter identification
  • support vector machine
  • variance dimension

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