Solving SOC test scheduling problem using cross-entropy method

Deng Libao; Qiao Liyan; Peng Xiyuan

doi:10.1117/12.885817

Solving SOC test scheduling problem using cross-entropy method

Deng Libao^*
, Qiao Liyan
, Peng Xiyuan

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

With the increase of the number of IP cores integrated in SOC, the functions of SOC are becoming more complexed. Test time and test cost grow rapidly, therefore it becomes bottleneck of SOC test. Test scheduling is one of the efficient approaches to solve the forenamed question. Cross-entropy method, which is based on probability density function, has been used to solve the SOC test scheduling problem. Experimental results on ITC'02 benchmarks show that the proposed method provides better test time results compared to the Linear-Programming.

Original language	English
Title of host publication	Sixth International Symposium on Precision Engineering Measurements and Instrumentation
DOIs	https://doi.org/10.1117/12.885817
State	Published - 2010
Event	6th International Symposium on Precision Engineering Measurements and Instrumentation - Hangzhou, China Duration: 8 Aug 2010 → 11 Aug 2010

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	7544
ISSN (Print)	0277-786X

Conference

Conference	6th International Symposium on Precision Engineering Measurements and Instrumentation
Country/Territory	China
City	Hangzhou
Period	8/08/10 → 11/08/10

Keywords

Cross-entropy method
System on chip
Test scheduling

Access to Document

10.1117/12.885817

Cite this

@inproceedings{05270cf743f641439af6e9e9887ab799,

title = "Solving SOC test scheduling problem using cross-entropy method",

abstract = "With the increase of the number of IP cores integrated in SOC, the functions of SOC are becoming more complexed. Test time and test cost grow rapidly, therefore it becomes bottleneck of SOC test. Test scheduling is one of the efficient approaches to solve the forenamed question. Cross-entropy method, which is based on probability density function, has been used to solve the SOC test scheduling problem. Experimental results on ITC'02 benchmarks show that the proposed method provides better test time results compared to the Linear-Programming.",

keywords = "Cross-entropy method, System on chip, Test scheduling",

author = "Deng Libao and Qiao Liyan and Peng Xiyuan",

year = "2010",

doi = "10.1117/12.885817",

language = "英语",

isbn = "9780819479402",

series = "Proceedings of SPIE - The International Society for Optical Engineering",

booktitle = "Sixth International Symposium on Precision Engineering Measurements and Instrumentation",

note = "6th International Symposium on Precision Engineering Measurements and Instrumentation ; Conference date: 08-08-2010 Through 11-08-2010",

}

Libao, D , Liyan, Q & Xiyuan, P 2010, Solving SOC test scheduling problem using cross-entropy method. in Sixth International Symposium on Precision Engineering Measurements and Instrumentation., 754427, Proceedings of SPIE - The International Society for Optical Engineering, vol. 7544, 6th International Symposium on Precision Engineering Measurements and Instrumentation, Hangzhou, China, 8/08/10. https://doi.org/10.1117/12.885817

Solving SOC test scheduling problem using cross-entropy method. / Libao, Deng ; Liyan, Qiao ; Xiyuan, Peng.
Sixth International Symposium on Precision Engineering Measurements and Instrumentation. 2010. 754427 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 7544).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Solving SOC test scheduling problem using cross-entropy method

AU - Libao, Deng

AU - Liyan, Qiao

AU - Xiyuan, Peng

PY - 2010

Y1 - 2010

N2 - With the increase of the number of IP cores integrated in SOC, the functions of SOC are becoming more complexed. Test time and test cost grow rapidly, therefore it becomes bottleneck of SOC test. Test scheduling is one of the efficient approaches to solve the forenamed question. Cross-entropy method, which is based on probability density function, has been used to solve the SOC test scheduling problem. Experimental results on ITC'02 benchmarks show that the proposed method provides better test time results compared to the Linear-Programming.

AB - With the increase of the number of IP cores integrated in SOC, the functions of SOC are becoming more complexed. Test time and test cost grow rapidly, therefore it becomes bottleneck of SOC test. Test scheduling is one of the efficient approaches to solve the forenamed question. Cross-entropy method, which is based on probability density function, has been used to solve the SOC test scheduling problem. Experimental results on ITC'02 benchmarks show that the proposed method provides better test time results compared to the Linear-Programming.

KW - Cross-entropy method

KW - System on chip

KW - Test scheduling

UR - https://www.scopus.com/pages/publications/79952754301

U2 - 10.1117/12.885817

DO - 10.1117/12.885817

M3 - 会议稿件

AN - SCOPUS:79952754301

SN - 9780819479402

T3 - Proceedings of SPIE - The International Society for Optical Engineering

BT - Sixth International Symposium on Precision Engineering Measurements and Instrumentation

T2 - 6th International Symposium on Precision Engineering Measurements and Instrumentation

Y2 - 8 August 2010 through 11 August 2010

ER -

Solving SOC test scheduling problem using cross-entropy method

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Keywords

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